DocumentCode :
772200
Title :
Impedance of TEM cells with equipment under test
Author :
Huang, K.M. ; Lin, Weisi
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume :
26
Issue :
9
fYear :
1990
fDate :
4/26/1990 12:00:00 AM
Firstpage :
560
Lastpage :
562
Abstract :
A quasi-Tem approach based on conformal transformation is used to determine the characteristic impedance of a TEM cell with symmetric equipment under test (EUT), for efficient operation of the TEM cell. Some numerical results are presented.
Keywords :
electric impedance; electric variables measurement; electromagnetic fields; electromagnetic waves; measurement theory; test equipment; waveguide components; EM field distribution; EM waves; TEM cells; characteristic impedance; conformal transformation; measurement; quasi-Tem approach; symmetric equipment under test;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900367
Filename :
48753
Link To Document :
بازگشت