Title :
Improved method to extract the short-circuit parameters of the BECM
Author :
Ngo, Khai D T ; Gangupomu, Ajay
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
fDate :
3/1/2003 12:00:00 AM
Abstract :
The current method for extracting the short-circuit broadband extended cantilever model (BECM) parameters requires measurement of short-circuit currents, and is problematic over a wide frequency range, prohibiting each short-circuit parameter to be directly measured. The improved method presented herein eliminates the measurements of short-circuit currents. Each short-circuit BECM parameter is directly found from two measurements, an open-circuit voltage gain and a short-circuit admittance. The method is demonstrated for a published five-winding BECM.
Keywords :
electric admittance; electric current measurement; magnetic circuits; short-circuit currents; transformer windings; broadband extended cantilever model; broadband winding model; magnetic windings; open-circuit voltage gain; short-circuit admittance; short-circuit currents measurement; short-circuit parameters; transformer windings; winding model; Admittance measurement; Current measurement; Electrochemical machining; Frequency measurement; Gain measurement; Impedance measurement; Sensor phenomena and characterization; Soldering; Voltage measurement; Windings;
Journal_Title :
Power Electronics Letters, IEEE
DOI :
10.1109/LPEL.2003.813479