Title :
Suppression of InP substrate degradation by hydrogen plasma caused by the presence of phosphorus vapour
Author :
Schutz, Roland ; Matsushita, Kazuki ; Hartnagel, H.L. ; Krawczyk, S.K.
Author_Institution :
Inst. fur Hochfrequenztech., Tech. Hochschule Darmstadt, West Germany
fDate :
4/26/1990 12:00:00 AM
Abstract :
It is demonstrated that the degradation of InP substrates in a hydrogen plasma can be prevented by the introduction of phosphorus vapour into the reaction chamber. The results obtained, using standard surface analysis techniques and photoluminescence depth profiling, indicate that the stoichiometry of the InP surface region can be preserved and the number of P-vacancies which diffuse into the bulk drastically reduced.
Keywords :
III-V semiconductors; indium compounds; photoluminescence; plasma deposition; semiconductor technology; sputter etching; substrates; H plasma; II-V semiconductors; InP substrate; P vapour; PH 3; degradation suppression; photoluminescence depth profiling; standard surface analysis techniques; surface region stoichiometry; surface treatment;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900369