DocumentCode :
772219
Title :
Suppression of InP substrate degradation by hydrogen plasma caused by the presence of phosphorus vapour
Author :
Schutz, Roland ; Matsushita, Kazuki ; Hartnagel, H.L. ; Krawczyk, S.K.
Author_Institution :
Inst. fur Hochfrequenztech., Tech. Hochschule Darmstadt, West Germany
Volume :
26
Issue :
9
fYear :
1990
fDate :
4/26/1990 12:00:00 AM
Firstpage :
564
Lastpage :
566
Abstract :
It is demonstrated that the degradation of InP substrates in a hydrogen plasma can be prevented by the introduction of phosphorus vapour into the reaction chamber. The results obtained, using standard surface analysis techniques and photoluminescence depth profiling, indicate that the stoichiometry of the InP surface region can be preserved and the number of P-vacancies which diffuse into the bulk drastically reduced.
Keywords :
III-V semiconductors; indium compounds; photoluminescence; plasma deposition; semiconductor technology; sputter etching; substrates; H plasma; II-V semiconductors; InP substrate; P vapour; PH 3; degradation suppression; photoluminescence depth profiling; standard surface analysis techniques; surface region stoichiometry; surface treatment;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900369
Filename :
48755
Link To Document :
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