DocumentCode :
772368
Title :
Dual Experimental Approach for Thermal Impacts on Electromagnetic Behavior of Electronic Circuit Board Configurations
Author :
Dienot, Jean-Marc ; Batista, Emmanuel ; Bernard, Michel
Author_Institution :
Dept. of Electr. & Data Process. Eng., Univ. Inst. of Technol., Tarbes
Volume :
57
Issue :
11
fYear :
2008
Firstpage :
2405
Lastpage :
2413
Abstract :
Some effects of physical parameters, such as temperature, on electromagnetic emission or susceptibility of electronic circuit boards are nonnegligible and can be enforced by new integrated complex electronic structures. This paper describes experimental improvements proposed on near-field and radiated-mode test setups, including the temperature parameter. New experimental investigations and methodology are driven to estimate the real external thermal impacts on electromagnetic behavior and compliance. With pertinent characterization results, a review of wideband frequency modifications of electromagnetic compatibility (EMC) responses on electronic configurations with active digital devices and a printed circuit board (PCB) wire network is presented and analyzed.
Keywords :
electromagnetic compatibility; printed circuit testing; printed circuits; EMC; PCB; active digital devices; electromagnetic compatibility; electromagnetic emission; electromagnetic susceptibility; electronic circuit boards; integrated complex electronic structures; near-field test setups; printed circuit board; radiated-mode test setups; temperature effects; thermal impacts; wire network; Characterization; electromagnetic compatibility (EMC); electromagnetic field; printed circuit board (PCB); radiated mode; temperature; test setup; thermal impact;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2008.926379
Filename :
4549866
Link To Document :
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