DocumentCode :
772583
Title :
Charge-injection noise in CCDs
Author :
Kern, Brian
Author_Institution :
California Inst. of Technol., Pasadena, CA
Volume :
53
Issue :
10
fYear :
2006
Firstpage :
2478
Lastpage :
2484
Abstract :
An analysis of the noise associated with electronic charge injection in charge-coupled devices (CCDs) is presented, including the effects of diffusion currents. The capacitance of the injection circuit determines the charge-injection noise, and specification of the noise requires consideration of the quoted capacitance; for large charge packets, the noise has a characteristic variance of kTC/2 or kTC, depending on whether the capacitance is defined by microscopic (internal) or macroscopic (external) potentials. The variance is Poissonian for small charge packets. The noise values presented in this paper may serve as a target when optimizing charge-injection operation of a CCD
Keywords :
capacitance; charge injection; charge-coupled devices; semiconductor device models; semiconductor device noise; capacitance; charge injection noise; charge-coupled devices; diffusion currents effects; Acoustic noise; Capacitance; Charge coupled devices; Circuit noise; Consumer electronics; Degradation; Diodes; Energy resolution; Noise level; X-ray imaging; Charge-coupled devices (CCDs); MOSFETs; diffusion processes; shot noise;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2006.882271
Filename :
1705098
Link To Document :
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