DocumentCode :
772728
Title :
Power dependence of distributed cavity phase-induced frequency biases in atomic fountain frequency standards
Author :
Jefferts, Steven R. ; Shirley, Jon H. ; Ashby, Neil ; Burt, Eric A. ; Dick, G. John
Author_Institution :
Time & Frequency Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
52
Issue :
12
fYear :
2005
Firstpage :
2314
Lastpage :
2321
Abstract :
We discuss the implications of using high-power microwave tests in a fountain frequency standard to measure the frequency bias resulting from distributed cavity-phase shifts. We develop a theory which shows that the frequency bias from distributed cavity phase depends on the amplitude of the microwave field within the cavity. The dependence leads to the conclusion that the frequency bias associated with the distributed cavity phase is typically both misestimated and counted twice within the error budget of fountain frequency standards.
Keywords :
cavity resonators; frequency standards; hyperfine structure; atomic fountain frequency standards; distributed cavity frequency biases; distributed cavity-phase shifts; error budget; frequency bias; high-power microwave tests; hyperfine frequency; microwave field amplitude; phase-induced frequency biases; power dependence; Atomic measurements; Equations; Frequency estimation; Frequency measurement; Laser beams; Measurement standards; NIST; Propulsion; Space technology; Testing;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2005.1563276
Filename :
1563276
Link To Document :
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