DocumentCode :
772739
Title :
Phase noise in capacitively coupled micromechanical oscillators
Author :
Kaajakari, Ville ; Koskinen, Jukka K. ; Mattila, Tomi
Author_Institution :
VTT Inf. Technol., VTT Tech. Res. Centre of Finland, Espoo, Finland
Volume :
52
Issue :
12
fYear :
2005
Firstpage :
2322
Lastpage :
2331
Abstract :
Phase noise in capacitively coupled micro-resonator-based oscillators is investigated. A detailed analysis of noise mixing mechanisms in the resonator is presented, and the capacitive transduction is shown to be the dominant mechanism for low-frequency 1/f-noise mixing into the carrier sidebands. Thus, the capacitively coupled micromechanical resonators are expected to be more prone to the 1/f-noise aliasing than piezoelectrically coupled resonators. The analytical work is complemented with simulations, and a highly efficient and accurate simulation method for a quantitative noise analysis in closed-loop oscillator applications is presented. Measured phase noise for a microresonator-based oscillator is found to agree with the developed analytical and simulated noise models.
Keywords :
micromechanical resonators; oscillators; phase noise; capacitively coupled micromechanical oscillators; closed-loop oscillator; microresonator-based oscillators; noise mixing mechanisms; phase noise; quantitative noise analysis; Analytical models; Crystals; Electrostatics; Low-frequency noise; Microcavities; Micromechanical devices; Noise measurement; Oscillators; Phase noise; Silicon;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2005.1563277
Filename :
1563277
Link To Document :
بازگشت