• DocumentCode
    772812
  • Title

    Silicon-based fabrication process for production of optical waveguides

  • Author

    Johnston, I.R. ; Parker, G.J.

  • Author_Institution
    Dept. of Electron., Southampton Univ., UK
  • Volume
    143
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    37
  • Lastpage
    40
  • Abstract
    The fabrication of silicon waveguides for use as optical interconnects in silicon optoelectronic integrated circuits for wavelengths beyond 1.1 μm is described. The process does not require silicon-on-insulator technology, and only uses VLSI processing techniques. Long, thin mesas are etched from a silicon substrate and masked along their sides with silicon nitride. The ridges are then isotropically dry etched to undercut the walls. The remaining silicon is thermally oxidised to leave a single-crystal silicon core encased in silicon dioxide. The cross-sectional area of the silicon cores is determined by the anisotropic silicon etch and the oxidation time. Waveguides with dimensions six by four microns surrounded by a micron-thick oxide layer have been fabricated. Results of launching light of wavelength 1.5 μm into this structure show that it is suitable for optical interconnect applications
  • Keywords
    VLSI; elemental semiconductors; etching; integrated optoelectronics; optical fabrication; optical interconnections; optical waveguides; ridge waveguides; silicon; silicon compounds; 1 mum; 1.1 mum; 4 mum; 6 mum; Si; Si waveguides; Si-SiO2; VLSI processing techniques; cross-sectional area; etching; fabrication process; isotropic dry etching; optical interconnect applications; optical interconnects; optoelectronic integrated circuits; oxidation time; thin mesas;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:19960133
  • Filename
    487673