DocumentCode
772812
Title
Silicon-based fabrication process for production of optical waveguides
Author
Johnston, I.R. ; Parker, G.J.
Author_Institution
Dept. of Electron., Southampton Univ., UK
Volume
143
Issue
1
fYear
1996
fDate
2/1/1996 12:00:00 AM
Firstpage
37
Lastpage
40
Abstract
The fabrication of silicon waveguides for use as optical interconnects in silicon optoelectronic integrated circuits for wavelengths beyond 1.1 μm is described. The process does not require silicon-on-insulator technology, and only uses VLSI processing techniques. Long, thin mesas are etched from a silicon substrate and masked along their sides with silicon nitride. The ridges are then isotropically dry etched to undercut the walls. The remaining silicon is thermally oxidised to leave a single-crystal silicon core encased in silicon dioxide. The cross-sectional area of the silicon cores is determined by the anisotropic silicon etch and the oxidation time. Waveguides with dimensions six by four microns surrounded by a micron-thick oxide layer have been fabricated. Results of launching light of wavelength 1.5 μm into this structure show that it is suitable for optical interconnect applications
Keywords
VLSI; elemental semiconductors; etching; integrated optoelectronics; optical fabrication; optical interconnections; optical waveguides; ridge waveguides; silicon; silicon compounds; 1 mum; 1.1 mum; 4 mum; 6 mum; Si; Si waveguides; Si-SiO2; VLSI processing techniques; cross-sectional area; etching; fabrication process; isotropic dry etching; optical interconnect applications; optical interconnects; optoelectronic integrated circuits; oxidation time; thin mesas;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:19960133
Filename
487673
Link To Document