• DocumentCode
    772815
  • Title

    Rectifying Process in Surface Barrier Detectors

  • Author

    Siffert, P. ; Coche, A. ; Laustriat, G.

  • Author_Institution
    Departement de Chimie Nucléaire Centre de Recherches Nucléaires Strasbourg - Cronenbourg (France)
  • Volume
    11
  • Issue
    3
  • fYear
    1964
  • fDate
    6/1/1964 12:00:00 AM
  • Firstpage
    244
  • Lastpage
    248
  • Abstract
    As a part of research on surface barrier detectors the formation of rectifying contacts has been studied for gold on n-type silicon. It has been observed that rectifying properties appear only if the ambient gas gives negative surface charges upon adsorption. Experiments have been performed with several gases (air, oxygen...). During the formation process, the variation of reverse current is strongly modified if a d. c. field is applied. This effect shows the importance of oxygen ions in the process leading to inversion layer.
  • Keywords
    Alpha particles; Conductivity; Counting circuits; Detectors; Gases; Gold; Semiconductor-metal interfaces; Silicon; Surface treatment; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1964.4323429
  • Filename
    4323429