DocumentCode
772815
Title
Rectifying Process in Surface Barrier Detectors
Author
Siffert, P. ; Coche, A. ; Laustriat, G.
Author_Institution
Departement de Chimie Nucléaire Centre de Recherches Nucléaires Strasbourg - Cronenbourg (France)
Volume
11
Issue
3
fYear
1964
fDate
6/1/1964 12:00:00 AM
Firstpage
244
Lastpage
248
Abstract
As a part of research on surface barrier detectors the formation of rectifying contacts has been studied for gold on n-type silicon. It has been observed that rectifying properties appear only if the ambient gas gives negative surface charges upon adsorption. Experiments have been performed with several gases (air, oxygen...). During the formation process, the variation of reverse current is strongly modified if a d. c. field is applied. This effect shows the importance of oxygen ions in the process leading to inversion layer.
Keywords
Alpha particles; Conductivity; Counting circuits; Detectors; Gases; Gold; Semiconductor-metal interfaces; Silicon; Surface treatment; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1964.4323429
Filename
4323429
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