DocumentCode :
772815
Title :
Rectifying Process in Surface Barrier Detectors
Author :
Siffert, P. ; Coche, A. ; Laustriat, G.
Author_Institution :
Departement de Chimie Nucléaire Centre de Recherches Nucléaires Strasbourg - Cronenbourg (France)
Volume :
11
Issue :
3
fYear :
1964
fDate :
6/1/1964 12:00:00 AM
Firstpage :
244
Lastpage :
248
Abstract :
As a part of research on surface barrier detectors the formation of rectifying contacts has been studied for gold on n-type silicon. It has been observed that rectifying properties appear only if the ambient gas gives negative surface charges upon adsorption. Experiments have been performed with several gases (air, oxygen...). During the formation process, the variation of reverse current is strongly modified if a d. c. field is applied. This effect shows the importance of oxygen ions in the process leading to inversion layer.
Keywords :
Alpha particles; Conductivity; Counting circuits; Detectors; Gases; Gold; Semiconductor-metal interfaces; Silicon; Surface treatment; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1964.4323429
Filename :
4323429
Link To Document :
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