Title :
Uniform and Stable dE/dx P-n Junction Particle Detectors
Author :
Madden, T.C. ; Gibson, W.M.
Author_Institution :
Bell Telephone Laboratories, Incorporated Murray Hill, New Jersey
fDate :
6/1/1964 12:00:00 AM
Keywords :
Etching; Fabrication; Lapping; P-n junctions; Passivation; Radiation detectors; Silicon; Stability; Surface contamination; Telephony;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1964.4323431
