DocumentCode
772849
Title
Influence of surface roughness of Bragg reflectors on resonance characteristics of solidly-mounted resonators
Author
Chung, Chung-Jen ; Chen, Ying-Chung ; Cheng, Chien-Chuan ; Wei, Ching-Liang ; Kao, Kuo-Sheng
Author_Institution
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
Volume
54
Issue
4
fYear
2007
fDate
4/1/2007 12:00:00 AM
Firstpage
802
Lastpage
808
Abstract
The solidly mounted resonator (SMR) is fabricated using planar processes from a piezoelectric layer sandwiched between two electrodes upon Bragg reflectors, which then are attached to a substrate. To transform the effective acoustic impedance of the substrate to a near zero value, the Bragg reflectors are composed of alternating high and low acoustic impedance layers of quarter-wavelength thickness. This paper presents the influence of Bragg reflector surface roughness on the resonance characteristics of a SMR. Originally, an AlN/Al multilayer is used as the Bragg reflector. The poor surface roughness of this Bragg reflector results in a poor SMR frequency response. To improve the surface roughness of Bragg reflectors, a molybdenum (Mo)/titanium (Ti) multilayer with a similar coefficient of thermal expansion is adopted. By controlling deposition parameters, the surface roughness of the Bragg reflector is improved, and better resonance characteristics of SMR are obtained
Keywords
acoustic impedance; acoustic resonators; bulk acoustic wave devices; metallic thin films; molybdenum; multilayers; piezoelectric thin films; sputter deposition; surface roughness; thermal expansion; titanium; Bragg reflectors; Mo-Ti; acoustic impedance; coefficient of thermal expansion; electrodes; magnetron sputtering; multilayer; piezoelectric layer; solidly-mounted resonators; substrate; surface roughness; Electrodes; Nonhomogeneous media; Radio frequency; Resonance; Rough surfaces; Semiconductor thin films; Sputtering; Substrates; Surface impedance; Surface roughness;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2007.313
Filename
4154640
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