DocumentCode :
772884
Title :
Reduction of internal current measurements within the failure bounds analogue diagnosis scheme
Author :
Garrett, C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Brighton Polytech., UK
Volume :
26
Issue :
9
fYear :
1990
fDate :
4/26/1990 12:00:00 AM
Firstpage :
583
Lastpage :
584
Abstract :
One method of automating diagnosis of failures in analogue circuits is called failure bounds. Unfortunately current measurements, internal to the UUT, are required to give resolution of failures to component level. Two methods of eliminating internal current measurement whilst maintaining good resolution are introduced.
Keywords :
analogue circuits; electric current measurement; failure analysis; UUT; analogue circuits; component level; failure bounds analogue diagnosis scheme; internal current measurements; resolution;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19900382
Filename :
48768
Link To Document :
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