Title :
Reduction of internal current measurements within the failure bounds analogue diagnosis scheme
Author_Institution :
Dept. of Electr. & Electron. Eng., Brighton Polytech., UK
fDate :
4/26/1990 12:00:00 AM
Abstract :
One method of automating diagnosis of failures in analogue circuits is called failure bounds. Unfortunately current measurements, internal to the UUT, are required to give resolution of failures to component level. Two methods of eliminating internal current measurement whilst maintaining good resolution are introduced.
Keywords :
analogue circuits; electric current measurement; failure analysis; UUT; analogue circuits; component level; failure bounds analogue diagnosis scheme; internal current measurements; resolution;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900382