DocumentCode :
772952
Title :
High-frequency surface acoustic waves excited on thin-oriented LiNbO3 single-crystal layers transferred onto silicon
Author :
Pastureaud, Thomas ; Solal, Marc ; Biasse, Béatrice ; Aspar, Bernard ; Briot, Jean-Bernard ; Daniau, William ; Steichen, William ; Lardat, Raphäel ; Laude, Vincent ; Läens, Alain ; Friedt, Jean-Michel ; Ballandras, Sylvain
Author_Institution :
TEMEX, Sophia-Antipolis
Volume :
54
Issue :
4
fYear :
2007
fDate :
4/1/2007 12:00:00 AM
Firstpage :
870
Lastpage :
876
Abstract :
The need for high-frequency, wide-band filters has instigated many developments based on combining thin piezoelectric films and high acoustic velocity materials (sapphire, diamond-like carbon, silicon, etc.) to ease the manufacture of devices operating above 2 GHz. In the present work, a technological process has been developed to achieve thin-oriented, single-crystal lithium niobate (LiNbO3) layers deposited on (100) silicon wafers for the fabrication of radio-frequency (RF) surface acoustic wave (SAW) devices. The use of such oriented thin films is expected to favor large coupling coefficients together with a good control of the layer properties, enabling one to chose the best combination of layer orientation to optimize the device. A theoretical analysis of the elastic wave assumed to propagate on such a combination of material is first exposed. Technological aspects then are described briefly. Experimental results are presented and compared to the state of art
Keywords :
elastic waves; lithium compounds; piezoelectric thin films; surface acoustic waves; (100) silicon wafers; LiNbO3; Si; coupling coefficients; elastic wave; high-frequency surface acoustic waves; layer orientation; single-crystal lithium niobate; thin-oriented LiNbO3 single-crystal layers; Acoustic devices; Acoustic waves; Filters; Organic materials; Piezoelectric films; Radio frequency; Silicon; Surface acoustic wave devices; Surface acoustic waves; Wideband; Acoustics; Computer Simulation; Crystallization; Equipment Design; Equipment Failure Analysis; Materials Testing; Membranes, Artificial; Models, Theoretical; Niobium; Oxides; Radiation Dosage; Radio Waves; Radiometry; Silicon;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2007.321
Filename :
4154648
Link To Document :
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