• DocumentCode
    773025
  • Title

    Temperature-Aware Placement for SOCs

  • Author

    Tsai, Jeng-Liang ; Chen, Guoqiang ; Guoqiang Chen ; Goplen, Brent ; Qian, Haifeng ; Zhan, Yong ; Kang, Sung-Mo ; Wong, Martin D F ; Sapatnekar, Sachin S.

  • Author_Institution
    Wisconsin Univ., Madison, WI
  • Volume
    94
  • Issue
    8
  • fYear
    2006
  • Firstpage
    1502
  • Lastpage
    1518
  • Abstract
    Dramatic rises in the power consumption and integration density of contemporary systems-on-chip (SoCs) have led to the need for careful attention to chip-level thermal integrity. High temperatures or uneven temperature distributions may result not only in reliability issues, but also timing failures, due to the temperature-dependent nature of chip time-to-failure and delay, respectively. To resolve these issues, high-quality, accurate thermal modeling and analysis, and thermally oriented placement optimizations, are essential prior to tapeout. This paper first presents an overview of thermal modeling and simulation methods, such as finite-difference time domain, finite element, model reduction, random walk, and Green-function based algorithms, that are appropriate for use in placement algorithms. Next, two-dimensional and three-dimensional thermal-aware placement algorithms such as matrix-synthesis, simulated annealing, partition-driven, and force directed are presented. Finally, future trends and challenges are described
  • Keywords
    integrated circuit modelling; system-on-chip; thermal analysis; thermal management (packaging); 2D thermal-aware placement algorithms; 3D thermal-aware placement algorithms; systems-on-chip; temperature-aware placement; thermal modeling; thermal simulation methods; Delay; Energy consumption; Finite difference methods; Finite element methods; Partitioning algorithms; Power system reliability; Reduced order systems; Temperature distribution; Thermal force; Timing; Physical design; placement; thermal analysis; thermal simulation;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2006.879804
  • Filename
    1705139