TE/TM-Pass Polarizer Based on Lithium Niobate on Insulator Ridge Waveguide

Author

Saitoh, E. ; Kawaguchi, Yuki ; Saitoh, Kunimasa ; Koshiba, Masanori

Author_Institution

Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan

Volume

5

Issue

2

fYear

2013

fDate

Apr-13

Firstpage

6600610

Lastpage

6600610

Abstract

We propose a TE/TM-pass polarizer based on a shallow X-cut lithium niobate-on-insulator (LNOI) ridge waveguide. In shallow X-cut LNOI ridge waveguides, the leaky mode is interchanged between TE and TM polarization waves depending on the ridge waveguide height. The phenomenon does not occur in silicon-on-insulator ridge waveguides. We use this special loss mechanism for TE/TM-pass polarizers. We evaluate structural and wavelength dependencies of polarizers by a vectorial finite-element method. The extinction ratios of 108 dB/mm and 27 dB/mm are obtained for TE-pass and TM-pass polarizers.

Keywords

finite element analysis; lithium compounds; optical waveguides; ridge waveguides; TE polarization waves; TE/TM-pass polarizer; TM polarization waves; insulator ridge waveguide; leaky mode; shallow X-cut lithium niobate-on-insulator; vectorial finite-element method; Extinction ratio; Indexes; Optical waveguides; Photonics; Silicon compounds; Silicon on insulator technology; Slabs; Theory and design; waveguide devices; waveguides;

fLanguage

English

Journal_Title

Photonics Journal, IEEE

Publisher

ieee

ISSN

1943-0655

Type

jour

DOI

10.1109/JPHOT.2013.2250938

Filename

6472723