• DocumentCode
    773389
  • Title

    Nonlinear models for the intermodulation analysis of FET mixers

  • Author

    Peng, Solti ; McCleer, Patrick J. ; Haddad, George I.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    43
  • Issue
    5
  • fYear
    1995
  • fDate
    5/1/1995 12:00:00 AM
  • Firstpage
    1037
  • Lastpage
    1045
  • Abstract
    An accurate, detailed analysis program has been developed for intermodulation distortion (IMD) simulation of FET mixers. This program is very efficient at calculating the IMD from multiple RF inputs. We have proposed a simplified nonlinear model for IMD analysis of FET gate mixers. The accuracy of the simplified model has been verified experimentally using two different MESFET mixers and one HEMT mixer at X band. All the tests show good agreement between measured results and the calculated results for second- and third-order IMD. The simplified model is based on modeling the derivative of the device transconductance by a sum of a Gaussian function and a linear function of the gate voltage. Drain bias dependence is ignored. The advantage of this model is that it can be used for both MESFET and HEMT mixers, and its fitting parameters can be easily determined from a nonlinear characterization of the devices at low frequencies
  • Keywords
    HEMT integrated circuits; MESFET integrated circuits; MMIC mixers; circuit analysis computing; integrated circuit modelling; intermodulation distortion; FET gate mixers; Gaussian function; HEMT mixer; MESFET mixers; MMICs; X band; device transconductance; drain bias dependence; intermodulation analysis; intermodulation distortion; multiple RF inputs; nonlinear characterization; nonlinear models; Circuit simulation; Diodes; FETs; HEMTs; Harmonic analysis; MESFETs; Mixers; RF signals; Radio frequency; Signal analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.382063
  • Filename
    382063