DocumentCode :
773458
Title :
Features and Design Constraints for an Optimized SC Front-End Circuit for Capacitive Sensors With a Wide Dynamic Range
Author :
Heidary, Ali ; Meijer, Gerard C M
Author_Institution :
Dept. of Microelectron. & Comput. Eng., Delft Univ. of Technol., Delft
Volume :
43
Issue :
7
fYear :
2008
fDate :
7/1/2008 12:00:00 AM
Firstpage :
1609
Lastpage :
1616
Abstract :
This paper presents optimization criteria for an integrated switched-capacitor front-end circuit for capacitive sensors with a wide dynamic range. The principle of the interface is based on the use of a relaxation oscillator. A negative-feedback circuit controls the charge-transfer speed to prevent the overload of the input amplifier for large input signals which thus enables a wide dynamic range of capacitor values. Moreover, it has been shown that the use of negative feedback can also result in much better noise performance. However, for the interface to function properly, there is a serious limitation for the value of a specific parasitic capacitance. Therefore, a method which extends the acceptable range of this parasitic capacitance is proposed. A novel method of linearity measurement which takes the influence of PCB parasitic capacitances into account, is also presented. The circuit has been designed and implemented in 0.7 mum standard CMOS technology. The supply voltage is 5 V and the measured value for the supply current is about 1.4 mA. Experimental results show that for the capacitor range of 1 pF to 300 pF, application of negative feedback yields a linearity of about 50 x10-6 (14 bits) with a 16-bit resolution for a measurement time of 100 ms. Tests have been performed over the temperature range from to .
Keywords :
CMOS integrated circuits; capacitance measurement; capacitive sensors; switched capacitor networks; CMOS technology; capacitance measurement; capacitive sensors; integrated switched-capacitor front-end circuit; negative-feedback circuit; relaxation oscillator; CMOS technology; Capacitive sensors; Capacitors; Circuits; Constraint optimization; Design optimization; Dynamic range; Linearity; Negative feedback; Parasitic capacitance; Capacitance measurement; noise; nonlinearity; switched capacitor circuits;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.922390
Filename :
4550637
Link To Document :
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