Abstract :
Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.
Keywords :
VLSI; fault tolerance; integrated circuit reliability; VLSI; circuit reliability; deep-submicron technology; faults; intermittent faults; permanent faults; transient faults; Circuit faults; Copper; Electromigration; Frequency; Integrated circuit interconnections; Microprocessors; Random access memory; Semiconductor device manufacture; Very large scale integration; Voltage;
