DocumentCode :
773511
Title :
The use and abuse of SPEC: An ISCA panel
Author :
Hennessy, John ; Citron, Daniel ; Patterson, Dean
Author_Institution :
Stanford University
Volume :
23
Issue :
4
fYear :
2003
Firstpage :
73
Lastpage :
77
Keywords :
Aggregates; Electric breakdown; Multithreading;
fLanguage :
English
Journal_Title :
Micro, IEEE
Publisher :
ieee
ISSN :
0272-1732
Type :
jour
DOI :
10.1109/MM.2003.1225977
Filename :
1225977
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=773511
