مرکز منطقه ای اطلاع رساني علوم و فناوري - Call for papers-22nd IEEE International Conference on Microelectronic Test Structures

DocumentCode :

773524

Title :

Call for papers-22nd IEEE International Conference on Microelectronic Test Structures

Volume :

Issue :

fYear :

2008

fDate :

7/1/2008 12:00:00 AM

Firstpage :

1712

Lastpage :

1712

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

fLanguage :

English

Journal_Title :

Solid-State Circuits, IEEE Journal of

Publisher :

ieee

ISSN :

0018-9200

Type :

jour

DOI :

10.1109/JSSC.2008.927555

Filename :

4550643

Link To Document :