Title :
A 65 nm CMOS Multistandard, Multiband TV Tuner for Mobile and Multimedia Applications
Author :
Vassiliou, Iason ; Vavelidis, Kostis ; Haralabidis, Nikos ; Kyranas, Aris ; Kokolakis, Yiannis ; Bouras, Stamatis ; Kamoulakos, George ; Kapnistis, Charalambos ; Kavadias, Spyros ; Kanakaris, Nikos ; Metaxakis, Emmanouil ; Kokozidis, Christos ; Peyravi, H
Author_Institution :
Broadcom Hellas S.A., Alimos
fDate :
7/1/2008 12:00:00 AM
Abstract :
This paper presents a direct conversion, multistandard TV tuner implemented on a 65 nm digital CMOS process occupying less than 7 . The tuner is compliant with several digital terrestrial, fixed and mobile TV standards, including DVB-T, DVB-H, T-DMB, and ISDB-T. It achieves a 3/3.2/3.5 dB noise figure at VHF, UHF, and L-band, respectively, while the measured sensitivity at UHF for the QPSK-frac12 DVB-T mode is at the PCB connector. The implemented RF front-ends support both single-ended and differential inputs. An integrated - fractional-N synthesizer operating from 1.2 to 1.8 GHz achieves less than 1 integrated phase error, thus enabling a maximum SNR in excess of 37 dB for VHF and UHF. Multistandard capability is also enabled by programmable channel-select filters. Power consumption is less than 140 mW in DVB-T mode for all three bands.
Keywords :
CMOS digital integrated circuits; digital television; mobile television; tuning; CMOS multistandard TV tuner; DVB-T; L-band; UHF; VHF; digital CMOS process; digital terrestrial TV; direct conversion TV tuner; fixed TV; mobile TV; mobile applications; multiband TV tuner; multimedia applications; noise figure 3 dB; noise figure 3.2 dB; noise figure 3.5 dB; size 65 nm; CMOS process; Communication standards; Data communication; Digital multimedia broadcasting; Digital video broadcasting; L-band; Mobile TV; Multiplexing; Noise figure; Tuners; DVB-H; DVB-T; Direct conversion; ISDB-T; OFDM; RF CMOS; RF receiver; T-DMB; TV tuner; fractional-N synthesizer; mobile TV; system-on-a-chip (SOC); wireless;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.923721