Title :
Interface Electronics for a CMOS Electrothermal Frequency-Locked-Loop
Author :
Zhang, Cheng ; Makinwa, Kofi A A
Author_Institution :
Electron. Instrum. Lab., Delft Univ. of Technol., Delft
fDate :
7/1/2008 12:00:00 AM
Abstract :
This paper describes a new implementation of a CMOS electrothermal frequency-locked-loop (FLL), whose output frequency is determined by the temperature-dependent phase shift of an electrothermal filter (ETF). The FLL maintains a constant phase shift in the ETF, and as a result drives it with a signal whose frequency is a well-defined function of temperature. Compared to a previous implementation, the FLL described here has significantly more loop gain, less electrical phase-spread, and is more suitable for full integration. Measurements on 16 samples (from one batch) show that the temperature dependence of the FLL´s output frequency agrees very well with the known thermal properties of bulk silicon. The untrimmed spread of this frequency is less than plusmn0.45% (3sigma) from -40degC to 100degC, which corresponds to a temperature-sensing inaccuracy of less than plusmn0.7degC (3sigma).
Keywords :
CMOS integrated circuits; filters; frequency locked loops; temperature sensors; CMOS electrothermal frequency-locked-loop; bulk silicon; electrothermal filter; interface electronics; temperature sensor; temperature-dependent phase shift; thermal properties; Capacitors; Delay; Demodulation; Electrothermal effects; Filters; Frequency locked loops; Instruments; Temperature dependence; Temperature sensors; Voltage-controlled oscillators; Electrothermal filter; frequency-locked-loop; synchronous demodulator; temperature sensor;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.922405