Title :
An interconnect energy model considering coupling effects
Author :
Uchino, Taku ; Cong, Jason
Author_Institution :
STI-Design Center, Toshiba America Electron. Components, Austin, TX, USA
fDate :
7/1/2002 12:00:00 AM
Abstract :
This paper presents an analytical interconnect energy model with consideration of coupling effects, including crosstalk and glitch, which are not adequately considered by the conventional (1/2) CV2 model. The energy model introduces a new timescale parameter, called the charge time, which represents the correlation time length between two events and is considered to be the counterpart of the Elmore delay. The authors´ energy model is more accurate than the (1/2) CV2 model with the same time complexity. Experimental results show that their algorithm is several orders of magnitude faster than HSPICE with less than 5% error. In comparison, the error of the (1/2) CV2 model can be as high as 100%. The authors further investigate the relationship between interconnect energy and signal correlation and propose a simplified model, which is even faster than their basic model. This paper also discusses ongoing issues of their model, including stability analysis, event propagation, and resistive shielding effects in interconnect energy calculation
Keywords :
crosstalk; integrated circuit interconnections; integrated circuit modelling; (1/2) CV2 model; Elmore delay; HSPICE; analytical model; charge time; coupling effects; crosstalk; event propagation; glitch; interconnect energy; power estimation; resistive shielding; signal correlation; stability analysis; Analytical models; Capacitance; Coupling circuits; Crosstalk; Delay estimation; Integrated circuit interconnections; Mutual coupling; Power system interconnection; Power system modeling; Power system reliability;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2002.1013890