DocumentCode :
773747
Title :
Memory effects in EM emission during uniaxial deformation of dielectric Crystalline materials
Author :
Hadjicontis, Vassilios ; Tombras, George S. ; Ninos, Dimitrios ; Mavromatou, Clairi
Author_Institution :
Dept. of Phys., Univ. of Athens, Greece
Volume :
2
Issue :
2
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
118
Lastpage :
120
Abstract :
It is known that during uniaxial compression of dielectric crystalline materials, acoustic and electromagnetic (EM) emission is detected. Such emissions are of particular interest, since they are related to the physical processes taking place during the preparation stage of an earthquake. In this letter, we report recent experimental results on the memory effects observed in the EM emission during successive cyclic mechanical loading-unloading of LiF crystal samples in a similar fashion, as it has been described by the so-called "Kaiser effect," i.e., the memory effect for the acoustic emission, and we discuss on a conceptual explanation.
Keywords :
acoustic emission; dielectric materials; earthquakes; electromagnetic waves; microcracks; Kaiser effect; LiE crystal samples; acoustic emission; dielectric crystalline materials; earthquake precursors; electromagnetic emission; memory effects; microfracturing electrification; successive cyclic mechanical loading-unloading; uniaxial compression; uniaxial deformation; Acoustic emission; Acoustic materials; Acoustic signal detection; Crystalline materials; Dielectrics; Earthquakes; Instruments; Laboratories; Physics; Tensile stress; “Kaiser effect”; Acoustic emission; earthquake precursors; electromagnetic (EM) emission; microfracturing electrification;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2004.842472
Filename :
1420286
Link To Document :
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