Title :
Linear dependencies in extended LFSMs
Author :
Kagaris, Dimitri
Author_Institution :
Dept. of Electr & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
fDate :
7/1/2002 12:00:00 AM
Abstract :
In this paper, the linear dependencies of extended linear finite state machines (LFSMs) used as test pattern generators (TPGs) are examined. The TPG mechanism considered is a shift register whose initial portion is configured as an LFSM. This mechanism (LFSM/SR) can be used for pseudorandom and circuit-specific pseudoexhaustive test pattern generation. A formula is presented that relates the linear dependencies that can occur among the LFSM/SR cells with the characteristic polynomial of the LFSM. Previously, such an easily computable formula had only been established for Type-1 linear feedback shift registers (LFSRs). The generalization allows the fast determination of linear dependencies for any LFSM, including in particular Type-2 LFSRs and cellular automata
Keywords :
built-in self test; cellular automata; circuit feedback; finite state machines; shift registers; built-in self-test; cellular automata; extended linear finite state machine; linear dependence; linear feedback shift register; shift register; test pattern generator; Automatic testing; Built-in self-test; Circuit testing; Hardware; Linear feedback shift registers; Polynomials; Shift registers; Strontium; System testing; Test pattern generators;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2002.1013897
