Title :
Wide-aperture, line-focused ultrasonic material characterization system based on lateral scanning
Author :
Titov, Sergey ; Maev, Roman ; Bogatchenkov, Alexey
Author_Institution :
Windsor Univ., Ont., Canada
Abstract :
We present a new wide-aperture, line-focused ultrasonic material characterization system. The foci of the transmitting and receiving transducers are located in the specimen-immersion liquid interface; and the output voltage V(x, t) of the system is recorded as a function of the lateral position of the receiving transducer. The two-dimensional spectrum of V(x, t) can be expressed as a product of the transfer function of the system and the reflectance function of the interface. In comparison with a system based on scanning in the z direction, the angular resolution of the proposed technique increases with decreasing angle of incidence. There are no geometrical restrictions on the length of the recorded spatial data and the angle of incidence in the case of lateral scanning. The temperature coefficient of the measurement error is low because of the constancy of the propagation distance of ultrasound in the immersion fluid during data acquisition.
Keywords :
transfer functions; ultrasonic materials testing; ultrasonic transducers; angle of incidence; angular resolution; lateral position; lateral scanning; line-focused ultrasonic material characterization; measurement error; propagation distance; receiving transducers; recorded spatial data; reflectance function; specimen-immersion liquid interface; transfer function; transmitting transducers; two-dimensional spectrum; Acoustic transducers; Attenuation; Lenses; Optical materials; Reflectivity; Surface acoustic waves; Surface waves; Ultrasonic transducers; Ultrasonic variables measurement; Voltage;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2003.1226548