Title :
On the determination of surface emissivity from Satellite observations
Author :
Mätzler, Christian
Author_Institution :
Inst. of Appl. Phys., Univ. of Bern, Switzerland
fDate :
4/1/2005 12:00:00 AM
Abstract :
Terrestrial brightness temperatures measured from satellites have been used to determine the surface emissivity. The results not only depend on surface temperature and on atmospheric properties, but also on the type of surface scattering. For otherwise identical conditions (same emissivity, same nonscattering atmosphere), the radiation above the Lambertian surface is larger than for a specular surface if the incidence angle is smaller than about 55°. The opposite is true for larger angles. The effect leads to overestimates of emissivity for observations especially near nadir with the use of algorithms assuming specular reflection. The problem may be solved by the introduction of a specularity parameter to characterize realistic surfaces by a combination of specular and Lambert scattering. A simple solution lies in the use of conically scanning radiometers at a constant incidence angle near 55°. Although the topic applies to all ranges of thermal radiation, the present discussion concentrates on the microwave spectrum in the Rayleigh-Jeans approximation.
Keywords :
atmospheric optics; brightness; emissivity; light scattering; microwave measurement; radiative transfer; radiometers; remote sensing; Lambert scattering; Rayleigh-Jeans approximation; atmospheric optics; conically scanning radiometers; microwave measurement; radiometry; satellite observations; specular reflection; specular surface scattering; surface emissivity; surface temperature; terrestrial brightness temperatures; thermal radiation; Atmosphere; Atmospheric measurements; Brightness temperature; Radiometers; Rayleigh scattering; Reflection; Satellite broadcasting; Scattering parameters; Temperature dependence; Temperature measurement; Brightness temperature; Lambert; emissivity; microwaves; radiometry; specular; surface scattering;
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
DOI :
10.1109/LGRS.2004.842448