• DocumentCode
    773948
  • Title

    4.2-mW GaInNAs long-wavelength VCSEL grown by metalorganic chemical vapor deposition

  • Author

    Nishida, Tetsuo ; Takaya, Mitsuru ; Kakinuma, Satoshi ; Kaneko, Takeo

  • Author_Institution
    VIE Project, Epson Corp., Nagano, Japan
  • Volume
    11
  • Issue
    5
  • fYear
    2005
  • Firstpage
    958
  • Lastpage
    961
  • Abstract
    We achieved high output power GaInNAs vertical-cavity surface-emitting lasers (VCSELs) emitting at 1261.5 nm by means of decreasing the incorporation of aluminum into the GaInNAs well layers. The continuous wave (CW) output power at room temperature reached 4.2 mW, with a slope efficiency of 0.52 W/A. Secondary ion mass spectrometry (SIMS) analysis revealed that the aluminum incorporated into the GaInNAs layer did not originate from diffusion from the adjacent layers of GaInNAs, but from residual aluminum in the reactor.
  • Keywords
    III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; indium compounds; laser cavity resonators; quantum well lasers; secondary ion mass spectra; semiconductor growth; surface emitting lasers; 1261.5 nm; 293 to 298 K; 4.2 mW; GaInNAs; GaInNAs VCSEL; GaInNAs well layers; aluminum incorporation; continuous wave output power; high power laser; long-wavelength VCSEL; metalorganic chemical vapor deposition; residual aluminum; room temperature; secondary ion mass spectrometry; semiconductor growth; vertical cavity surface-emitting lasers; Aluminum; Chemical lasers; Chemical vapor deposition; Inductors; Mass spectroscopy; Power generation; Power lasers; Surface emitting lasers; Temperature; Vertical cavity surface emitting lasers; Aluminum; GaInNAs; long-wavelength lasers; metalorganic chemical vapor deposition (MOCVD); quantum-well (QW); secondary ion mass spectrometry (SIMS); vertical-cavity surface-emitting laser (VCSEL);
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2005.853734
  • Filename
    1564029