DocumentCode :
773978
Title :
Harnessing Machine Learning to Improve the Success Rate of Stimuli Generation
Author :
Fine, Shai ; Freund, Ari ; Jaeger, Itai ; Mansour, Yishay ; Naveh, Yehuda ; Ziv, Avi
Author_Institution :
IBM Haifa Res. Lab., Haifa Univ. Campus
Volume :
55
Issue :
11
fYear :
2006
Firstpage :
1344
Lastpage :
1355
Abstract :
The initial state of a design under verification has a major impact on the ability of stimuli generators to successfully generate the requested stimuli. For complexity reasons, most stimuli generators use sequential solutions without planning ahead. Therefore, in many cases, they fail to produce a consistent stimuli due to an inadequate selection of the initial state. We propose a new method, based on machine learning techniques, to improve generation success by learning the relationship between the initial state vector and generation success. We applied the proposed method in two different settings, with the objective of improving generation success and coverage in processor and system level generation. In both settings, the proposed method significantly reduced generation failures and enabled faster coverage
Keywords :
automatic test pattern generation; formal verification; learning (artificial intelligence); logic design; logic testing; initial state vector; machine learning harnessing; processor coverage; stimuli generation; system level generation; Bayesian methods; Event detection; Fourier transforms; Hardware; Law; Learning systems; Legal factors; Machine learning; Test pattern generators; Testing; Bayesian networks; Fourier transforms.; Functional verification; coverage analysis; coverage directed generation; machine learning;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2006.183
Filename :
1705444
Link To Document :
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