• DocumentCode
    775020
  • Title

    A new lateral anode switched thyristor (LAST) with current saturation and low turn-off time

  • Author

    You-Sang Lee ; Soo-Seong Kim ; Jae-Keun Oh ; Yearn-Ik Choi ; Min-Koo Han

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • Volume
    23
  • Issue
    7
  • fYear
    2002
  • fDate
    7/1/2002 12:00:00 AM
  • Firstpage
    413
  • Lastpage
    415
  • Abstract
    A novel MOS-gate controlled thyristor, entitled lateral anode switched thyristor (LAST), which exhibits a high current saturation and a low turn-off time, is proposed and successfully fabricated. Experimental results show that the new LAST achieves a current saturation capability larger than 1200 A/cm2 even at high anode voltages. The forward voltage drop of LAST is 1.2 V at 100 A/cm2 where 10 V was biased to the dual gates. The turn-off time of LAST without any lifetime-control process is 1.5 μs while that of LAST without p/sup +/ diverter is about 2.9 μs. Our experimental data indicates that the p/sup +/ diverter successfully diverts holes in the drift region during the turn-off and a turn-off time is considerably decreased in the proposed LAST. The LAST, where any trouble-some parasitic thyristor mechanism is eliminated, completely suppresses a latch-up and increases the maximum controllable current considerably.
  • Keywords
    MOS-controlled thyristors; insulated gate bipolar transistors; oxidation; power bipolar transistors; LOCOS; MOS-gate controlled thyristor; conventional IGBT fabrication process; current saturation; forward current-voltage characteristics; forward voltage drop; hole diverter; latch-up suppression; lateral anode switched thyristor; low turn-off time; p/sup +/ diverter; safe operating area; wet oxidation; Anodes; Cathodes; Impedance; Insulated gate bipolar transistors; MOSFET circuits; Power MOSFET; Semiconductor optical amplifiers; Switches; Thyristors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2002.1015222
  • Filename
    1015222