AFLP Analysis of Arabidopsis Thaliana Treated by Low-Energy Ion Beam

Author

Li, Ke ; Nie, Yanli ; Zhang, Dongzheng ; Zhang, Jun ; Zhang, Genfa

Author_Institution

Coll. of Life Sci., Beijing Normal Univ.

Volume

35

Issue

2

fYear

2007

fDate

4/1/2007 12:00:00 AM

Firstpage

454

Lastpage

459

Abstract

The mutagenic effects of ion implantation on arabidopsis thaliana were analyzed using an amplified fragment length polymorphism (AFLP) fingerprinting. The mutagenic effect of the C⁺ ion was on top of that of N⁺ at the same fluence. Sequence analysis of variant DNA fragments indicated that the transformation of bases appeared to be the dominant type of mutations induced by ion implantation. Molecular positional effect on mutagenesis arising from ion implantation was observed. The sequence composition of purine and pyrimidine bases flanking the mutation site had a major impact on the determination of transformation types. The mutations in a functional gene induced by the ion implantation were analyzed via molecular cloning and sequencing of mutant fragments by the AFLP

Keywords

DNA; biological effects of ionising particles; biomolecular effects of radiation; ion beam effects; ion implantation; polymorphism; DNA fragments; amplified fragment length polymorphism; arabidopsis thaliana; fingerprinting; ion implantation; low-energy ion beam; molecular cloning; molecular positional effect; mutagenesis; purine; pyrimidine; sequence composition; Bioinformatics; Cloning; DNA; Fingerprint recognition; Genetic mutations; Genomics; Ion beams; Ion implantation; Ionizing radiation; Sequences; arabidopsis thaliana; Amplified fragment length polymorphism (AFLP); DNA sequencing; ion-beam implantation;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/TPS.2007.893267

Filename

4154880