DocumentCode :
77532
Title :
A 40 nm Fully Integrated 82 mW Stereo Headphone Module for Mobile Applications
Author :
Abdelfattah, Khaled ; Galal, S. ; Mehr, I. ; Chen, Alex Jianzhong ; Chengyue Yu ; Tjie, Maurice ; Tekin, Ahmet ; Xicheng Jiang ; Brooks, T.L.
Author_Institution :
Broadcom, Irvine, CA, USA
Volume :
49
Issue :
8
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1702
Lastpage :
1714
Abstract :
An 82 mW fully integrated stereo ground-referenced headphone module is designed in 40 nm CMOS. Lower platform cost is enabled by integrating the headphone module on the same SoC as the baseband functions. Maintaining device reliability with direct battery hook-up and providing large output swing are major challenges for this work, and several techniques were employed to guarantee safe operation for all of the devices under various conditions. Area reduction techniques were utilized to reduce the die cost and achieve lower platform cost. The module supports direct battery hookup with a battery range from 3.1 to 4.5 V and achieves a minimum low frequency, i.e., 217 Hz, PSRR of 110 dB at the lowest battery voltage. Audio quality is preserved by achieving a dynamic range of 100 dB, THD+N of -84 dB at 10 mW output power, and 160 μV pop-and-click noise level during power-up and power-down. The module occupies an area of 0.675 mm 2 on the SoC.
Keywords :
CMOS integrated circuits; audio-frequency amplifiers; headphones; mobile radio; system-on-chip; CMOS technology; SoC; area reduction techniques; audio quality; baseband functions; device reliability; die cost; direct battery hook-up; gain 100 dB; gain 110 dB; large output swing; lower platform cost; mobile applications; pop-and-click noise level; power 10 mW; power 82 mW; size 0.675 mm; size 40 nm; stereo ground-referenced headphone module; voltage 160 muV; voltage 3.1 V to 4.5 V; Batteries; Headphones; Noise; Power generation; Reliability; Resistors; System-on-chip; Audio amplifier; class AB; headphone driver; over-voltage protection; pop and click suppression; power supply rejection;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2314449
Filename :
6797951
Link To Document :
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