DocumentCode
775347
Title
Arrays of Addressable Microcavity Plasma Devices
Author
Park, S.-J. ; Tchertchian, P.A. ; Sung, S.H. ; Spinka, T.M. ; Eden, J.G.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL
Volume
35
Issue
2
fYear
2007
fDate
4/1/2007 12:00:00 AM
Firstpage
215
Lastpage
222
Abstract
Addressable microcavity plasma devices with two- or three-electrode, dielectric barrier designs have been fabricated in 20 times 20 or 50 times 50 device arrays in Si(100) and characterized in the rare gases. Each device comprises a metal/Si electrode structure, a dielectric stack, and an inverted square pyramid microcavity having an emitting aperture of 50times50 mum2 or 100times100 mum2. Arrays with filling factors of 11% and 25% [for (100 mum)2 and (50 mum)2 device arrays, respectively] and a crossed electrode (passive matrix) geometry exhibit operating voltages in Ne of ~220-300 V (RMS) when driven by a 20-kHz sinusoidal driving voltage. Displacement currents are ~50% of those for previous Si microplasma device arrays, and when exciting the array with 100-140-V pulses, the rise time of the wavelength-integrated fluorescence is observed to be < 600 ns for pure Ne or Ne/5%Xe gas mixtures at a pressure of 700 torr. A full address and sustain pulse sequence has also been demonstrated with a symmetrical three-electrode device structure
Keywords
fluorescence; gas mixtures; microcavities; micromechanical devices; neon; plasma devices; plasma diagnostics; xenon; 100 to 140 V; 20 kHz; 700 torr; Ne; Ne-Xe; Si; dielectric barrier designs; displacement currents; inverted square pyramid microcavity; microcavity plasma devices; sinusoidal driving voltage; sustain pulse sequence; three-electrode device structure; wavelength-integrated fluorescence; Apertures; Dielectric devices; Electrodes; Filling; Fluorescence; Gases; Geometry; Microcavities; Plasma devices; Voltage; Addressable; displays; microdischarge; microplasma; silicon devices;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2007.893467
Filename
4154896
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