Title :
Facial expression recognition from line-based caricatures
Author :
Gao, Yongsheng ; Leung, Maylor K H ; Hui, Siu Cheung ; Tananda, Mario W.
Author_Institution :
Sch. of Microelectron. Eng., Griffith Univ., Brisbane, Australia
fDate :
5/1/2003 12:00:00 AM
Abstract :
The automatic recognition of facial expression presents a significant challenge to the pattern analysis and man-machine interaction research community. Recognition from a single static image is particularly a difficult task. In this paper, we present a methodology for facial expression recognition from a single static image using line-based caricatures. The recognition process is completely automatic. It also addresses the computational expensive problem and is thus suitable for real-time applications. The proposed approach uses structural and geometrical features of a user sketched expression model to match the line edge map (LEM) descriptor of an input face image. A disparity measure that is robust to expression variations is defined. The effectiveness of the proposed technique has been evaluated and promising results are obtained. This work has proven the proposed idea that facial expressions can be characterized and recognized by caricatures.
Keywords :
computational complexity; face recognition; real-time systems; LEM descriptor; computational expense; disparity measure; expression variation robustness; facial expression recognition; geometrical features; line edge map descriptor; line-based caricatures; man-machine interaction; pattern analysis; real-time applications; structural features; user sketched expression model; Face recognition; Facial features; Humans; Image motion analysis; Image recognition; Image sequences; Independent component analysis; Man machine systems; Motion measurement; Pattern analysis;
Journal_Title :
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
DOI :
10.1109/TSMCA.2003.817057