• DocumentCode
    775605
  • Title

    Novel blind multiple watermarking technique for images

  • Author

    Wong, Peter H W ; Au, Oscar C. ; Yeung, Y.M.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
  • Volume
    13
  • Issue
    8
  • fYear
    2003
  • Firstpage
    813
  • Lastpage
    830
  • Abstract
    Three novel blind watermarking techniques are proposed to embed watermarks into digital images for different purposes. The watermarks are designed to be decoded or detected without the original images. The first one, called single watermark embedding (SWE), is used to embed a watermark bit sequence into digital images using two secret keys. The second technique, called multiple watermark embedding (MWE), extends SWE to embed multiple watermarks simultaneously in the same watermark space while minimizing the watermark (distortion) energy. The third technique, called iterative watermark embedding (IWE), embeds watermarks into JPEG-compressed images. The iterative approach of IWE can prevent the potential removal of a watermark in the JPEG recompression process. Experimental results show that embedded watermarks using the proposed techniques can give good image quality and are robust in varying degree to JPEG compression, low-pass filtering, noise contamination, and print-and-scan.
  • Keywords
    data compression; data encapsulation; image coding; iterative methods; minimisation; watermarking; JPEG-compressed images; blind multiple watermarking; image watermarking; iterative watermark embedding; low-pass filtering; multiple watermark embedding; noise contamination; print-and-scan; recompression process; secret keys; single watermark embedding; watermark bit sequence; Decoding; Digital images; Filtering; Image coding; Image quality; Iterative methods; Low pass filters; Noise robustness; Transform coding; Watermarking;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems for Video Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8215
  • Type

    jour

  • DOI
    10.1109/TCSVT.2003.815948
  • Filename
    1227610