Title :
A CMOS monolithic ΔΣ-controlled fractional-N frequency synthesizer for DCS-1800
Author :
De Muer, Bram ; Steyaert, Michel S J
Author_Institution :
Dept. Elektrotechniek, Katholieke Univ., Leuven, Heverlee, Belgium
fDate :
7/1/2002 12:00:00 AM
Abstract :
A monolithic 1.8-GHz ΔΣ-controlled fractional-N phase-locked loop (PLL) frequency synthesizer is implemented in a standard 0.25-μm CMOS technology. The monolithic fourth-order type-II PLL integrates the digital synthesizer part together with a fully integrated LC VCO, a high-speed prescaler, and a 35-kHz dual-path loop filter on a die of only 2×2 mm2. To investigate the influence of the ΔΣ modulator on the synthesizer´s spectral purity, a fast nonlinear analysis method is developed and experimentally verified. Nonlinear mixing in the phase-frequency detector (PFD) is identified as the main source of spectral pollution in ΔΣ fractional-N synthesizers. The design of the zero-dead zone PFD and the dual charge pump is optimized toward linearity and spurious suppression. The frequency synthesizer consumes 35 mA from a single 2-V power supply. The measured phase noise is as low as -120 dBc/Hz at 600 kHz and -139 dBc/Hz at 3 MHz. The measured fractional spur level is less than -100 dBc, even for fractional frequencies close to integer multiples of the reference frequency, thereby satisfying the DCS-1800 spectral purity constraints
Keywords :
CMOS integrated circuits; UHF integrated circuits; frequency synthesizers; phase locked loops; phase noise; sigma-delta modulation; 0.25 micron; 1.8 GHz; 2 V; 35 mA; CMOS monolithic ΔΣ-controlled fractional-N frequency synthesizer; DCS-1800; LC VCO; RF integrated circuit; digital synthesizer; dual charge pump; dual-path loop filter; fourth-order type-II phase-locked loop; fractional spur level; nonlinear mixing; phase noise; prescaler; spectral purity; zero-dead zone phase-frequency detector; CMOS technology; Charge pumps; Delta modulation; Digital filters; Frequency synthesizers; Phase detection; Phase frequency detector; Phase locked loops; Pollution measurement; Voltage-controlled oscillators;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2002.1015680