DocumentCode
775778
Title
Effective Radii of On-Chip Decoupling Capacitors
Author
Popovich, Mikhail ; Sotman, Michael ; Kolodny, Avinoam ; Friedman, Eby G.
Author_Institution
CDMA Technol., Qualcomm Corp., San Diego, CA
Volume
16
Issue
7
fYear
2008
fDate
7/1/2008 12:00:00 AM
Firstpage
894
Lastpage
907
Abstract
Decoupling capacitors are widely used to reduce power supply noise. On-chip decoupling capacitors have traditionally been allocated into the white space available on a die or placed inside the rows in standard cell circuit blocks. The efficacy of on-chip decoupling capacitors depends upon the impedance of the power/ground lines connecting the capacitors to the current loads and power supplies. A design methodology for placing on-chip decoupling capacitors is presented in this paper. A maximum effective radius is shown to exist for each on-chip decoupling capacitor. Beyond this effective distance, a decoupling capacitor is ineffective. Depending upon the parasitic impedance of the power distribution system, the maximum voltage drop seen at the current load is caused either by the first droop (determined by the rise time) or by the second droop (determined by the transition time). Two criteria to estimate the minimum required on-chip decoupling capacitance are developed based on the critical parasitic impedance. In order to provide the required charge drawn by the load, the decoupling capacitor has to be charged before the next switching cycle. For an on-chip decoupling capacitor to be effective, both effective radii criteria should be simultaneously satisfied.
Keywords
capacitors; integrated circuit design; integrated circuit noise; critical parasitic impedance; integrated circuit design; integrated circuit power distribution noise; on-chip decoupling capacitors; power supply noise; power-ground lines; standard cell circuit blocks; Capacitors; Circuit noise; Design methodology; Impedance; Joining processes; Noise reduction; Power distribution; Power supplies; Voltage; White spaces; Decoupling capacitors; power distribution systems; power supply noise; signal integrity;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2008.2000454
Filename
4553752
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