DocumentCode :
776532
Title :
Gain measurement of high characteristic temperature 1.3 μm GaInAsP/InP strained-layer quantum well lasers with temperature dependent reflectivity (TDR) mirror
Author :
Kasukawa, A. ; Iwai, N. ; Yamanaka, N. ; Hosotani, A. ; Yokouchi, N.
Author_Institution :
Res. & Dev. Lab., Furukawa Electr. Co. Ltd., Yokohama, Japan
Volume :
31
Issue :
8
fYear :
1995
fDate :
4/13/1995 12:00:00 AM
Firstpage :
644
Lastpage :
645
Abstract :
By comparing the optical gain of 1.3 μm strained-layer quantum well lasers with characteristic temperatures T0 of 150 K (high) and 60 K (typical), it is found that temperature insensitive net gain plays an important role in reducing the temperature sensitivity of the threshold current. The resonance frequency for high T0 lasers exhibits temperature insensitivity, resulting from the temperature insensitive net gain characteristics
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; laser mirrors; laser variables measurement; optical modulation; quantum well lasers; 1.3 micron; 150 K; 60 K; GaInAsP-InP; characteristic temperature; net gain characteristics; optical gain; resonance frequency; strained-layer quantum well lasers; temperature dependent reflectivity mirror; temperature insensitive net gain; threshold current;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19950381
Filename :
384008
Link To Document :
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