Title :
A superconducting X-ray spectrometer with a tantalum absorber and lateral trapping
Author :
Gaidis, M.C. ; Friedrich, S. ; Segall, K. ; Prober, D.E. ; Szymkowiak, A.E. ; Moseley, S.H.
Author_Institution :
Dept. of Appl. Phys., Yale Univ., New Haven, CT, USA
fDate :
3/1/1996 12:00:00 AM
Abstract :
We report the development of Nb-Ta-Al-Al/sub 2/O/sub 3/-Al superconducting tunnel junction structures for high energy resolution and high efficiency X-ray detection. These devices utilize a Ta X-ray absorber with superconductor "bandgap engineered" quasiparticle trapping to improve charge collection. Experimental results at 0.3 K are presented, showing energy resolution of 102 eV full-width-half-maximum for 6 keV X-rays. Collected charge is in excess of 5/spl times/10/sup 6/ electrons. The absorption efficiency is better than 35%. Devices thermally cycle with no change in characteristics.
Keywords :
X-ray absorption; X-ray detection; X-ray spectrometers; superconducting device testing; superconducting thin films; superconductive tunnelling; superconductor-insulator-superconductor devices; 0.3 K; 35 percent; 6 keV; Nb-Ta-Al-Al/sub 2/O/sub 3/-Al; SIS devices; X-ray absorber; absorption efficiency; energy resolution; lateral trapping; soft X-ray detector; superconducting X-ray spectrometer; superconducting tunnel junction structures; superconductor bandgap-engineered quasiparticle trapping; thermal cycling; Conducting materials; Electromagnetic wave absorption; Energy resolution; Josephson junctions; Spectroscopy; Superconducting devices; Superconducting films; Superconducting materials; X-ray detection; X-ray detectors;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
