Title :
Measurement of inductive coupling between coplanar superconducting transmission lines
Author :
Klockau, J. ; Fotheringham, G. ; Hahn, R.
Author_Institution :
Technologien der Mikroperipherik, Tech. Univ. Berlin, Germany
fDate :
3/1/1996 12:00:00 AM
Abstract :
By measuring forward and backward coupling between superconducting coplanar transmission lines at various temperatures, we determined the dependence of inductive coupling on the London penetration depth. If the transmission lines are separated by a shielding ground line, inductive coupling increases with increasing penetration depth. If the shielding line is damaged or absent, there is a slight decrease. Since both effects are in the percentage range, they can only be observed in the forward-coupled noise signal. The backward coupled noise is nearly temperature independent. We measured inductive coupling factors between 6 and 8% on 10- and 5-/spl mu/m-wide transmission lines, which are separated by a shielding ground line. Excellent agreement was obtained between measurements and FEM simulations.
Keywords :
crosstalk; finite element analysis; penetration depth (superconductivity); superconducting interconnections; 10 micron; 5 micron; FEM simulations; London penetration depth; backward coupled noise; backward coupling; coplanar superconducting transmission lines; forward coupling; forward-coupled noise signal; inductive coupling; shielding ground line; Circuit simulation; Coplanar transmission lines; Coupling circuits; Crosstalk; Impedance; Land surface temperature; Semiconductor device measurement; Superconducting device noise; Superconducting transmission lines; Transmission line measurements;
Journal_Title :
Applied Superconductivity, IEEE Transactions on