Title :
Switching activity estimation of VLSI circuits using Bayesian networks
Author :
Bhanja, Sanjukta ; Ranganathan, N.
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
Abstract :
Switching activity estimation is an important aspect of power estimation at circuit level. Switching activity in a node is temporally correlated with its previous value and is spatially correlated with other nodes in the circuit. It is important to capture the effects of such correlations while estimating the switching activity of a circuit. In this paper, we propose a new switching probability model for combinational circuits that uses a logic-induced directed-acyclic graph (LIDAG) and prove that such a graph corresponds to a Bayesian network (BN), which is guaranteed to map all the dependencies inherent in the circuit. BNs can be used to effectively model complex conditional dependencies over a set of random variables. The BN inference schemes serve as a computational mechanism that transforms the LIDAG into a junction tree of cliques to allow for probability propagation by local message passing. The proposed approach is accurate and fast. Switching activity estimation of ISCAS and MCNC circuits with random and biased input streams yield high accuracy (average mean error=0.002) and low computational time (average elapsed time including CPU, memory access and I/O time for the benchmark circuits=3.93 s).
Keywords :
VLSI; belief networks; directed graphs; integrated circuit modelling; logic simulation; probability; Bayesian network; Bayesian networks; ISCAS circuits; LIDAG; MCNC circuits; VLSI circuits; computational mechanism; computational time; conditional dependencies; junction tree; local message passing; logic-induced directed acyclic graph; power estimation; probability propagation; switching activity estimation; switching probability model; Bayesian methods; Combinational circuits; Energy consumption; IEEE activities; Message passing; Parasitic capacitance; Random variables; Switching circuits; Very large scale integration; Yield estimation;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2003.816144