• DocumentCode
    776742
  • Title

    A low-power charge-recycling ROM architecture

  • Author

    Yang, Byung-Do ; Kim, Lee-Sup

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • Volume
    11
  • Issue
    4
  • fYear
    2003
  • Firstpage
    590
  • Lastpage
    600
  • Abstract
    This paper describes a newly proposed low-power charge-recycling read-only memory (CR-ROM) architecture. The CR-ROM reduces the power consumption in bit lines, word lines, and precharge lines by recycling the previously used charge. In the proposed CR-ROM, bit-line swing voltage is lowered by the charge recycling between bit lines. When N bit lines recycle their charges, the swing voltage and the power of the bit lines become 1/N and 1/N/sup 2/ compared to the conventional ROMs, respectively. As the number of N increases, the power saving in bit lines becomes salient. Also, power consumption in word lines and precharge lines can be reduced theoretically to half by the proposed charge-recycling techniques. The simulation results show that the CR-ROM consumes 60%/spl sim/85% of the conventional low-power ROMs with 1 K /spl times/ 32 b. A CR-ROM with 32 Kb was implemented in a 0.35-/spl mu/m CMOS process. The power dissipation is 6.60 mW at 100 MHz with 3.3 V and the maximum operating clock frequency is 150 MHz.
  • Keywords
    CMOS memory circuits; VLSI; low-power electronics; memory architecture; read-only storage; 0.35 micron; 100 MHz; 150 MHz; 3.3 V; 32 Kbit; 6.60 mW; CR-ROM; bit lines; bit-line swing voltage; charge-recycling ROM architecture; low-power ROMs; low-power architecture; maximum operating clock frequency; power consumption; power dissipation; precharge lines; word lines; CMOS process; Capacitance; Clocks; Energy consumption; Memory architecture; Power dissipation; Read only memory; Recycling; Very large scale integration; Voltage;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2003.816138
  • Filename
    1229867