DocumentCode
776842
Title
Low-leakage asymmetric-cell SRAM
Author
Azizi, Navid ; Najm, Farid N. ; Moshovos, Andreas
Author_Institution
Electr. & Comput. Eng. Dept., Univ. of Toronto, Ont., Canada
Volume
11
Issue
4
fYear
2003
Firstpage
701
Lastpage
715
Abstract
We introduce a novel family of asymmetric dual-V/sub t/ static random access memory cell designs that reduce leakage power in caches while maintaining low access latency. Our designs exploit the strong bias toward zero at the bit level exhibited by the memory value stream of ordinary programs. Compared to conventional symmetric high-performance cells, our cells offer significant leakage reduction in the zero state and, in some cases, also in the one state, albeit to a lesser extent. A novel sense amplifier, in combination with dummy bitlines, allows for read times to be on par with conventional symmetric cells. With one cell design, leakage is reduced by 7/spl times/ (in the zero state) with no performance degradation, but with a stability degradation of 6%. Another cell design reduces leakage by 2/spl times/ (in the zero state) with no performance or stability loss. An alternative cell design reduces leakage by 58/spl times/ (in the zero state) with a performance degradation of 1% and an area increase of 2.4% and no stability degradation.
Keywords
SRAM chips; cache storage; circuit stability; leakage currents; access latency; asymmetric-cell SRAM; caches; dummy bitlines; leakage power; leakage reduction; memory value stream; performance degradation; read times; sense amplifier; stability degradation; Degradation; Delay; Leakage current; MOSFETs; Power dissipation; Random access memory; SRAM chips; Stability; System-on-a-chip; Threshold voltage;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2003.816139
Filename
1229876
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