DocumentCode :
776901
Title :
A 150 K channelless gate array design in 0.5-μm CMOS technology
Author :
Anderson, Floyd E. ; Ford, Jenny M.
Author_Institution :
Motorola Semicond. Res. & Dev. Lab., Phoenix, AZ, USA
Volume :
23
Issue :
2
fYear :
1988
fDate :
4/1/1988 12:00:00 AM
Firstpage :
520
Lastpage :
522
Abstract :
The chip presented was designed as a vehicle to investigate the advantages and tradeoffs of using 0.5-μm technology for semicustom VLSI devices. The use of 0.5-μm technology requires that a 3.3-V supply be used. Several architectures were investigated for maximum efficiency and ease of use with place and route software, keeping in mind tradeoffs between routability, performance, and density. The problem of providing an adequate power distribution system that did not hinder array efficiency was addressed, and the provision of high-speed high-integrity clock signals to provide system speeds up to 100 MHz was a major consideration. The unique core cell, designed for this array to fully utilize the advantages of the technology, is discussed. System considerations such as synchronous data operations and testability were met by the inclusion of level-sensitive set-scan registers as an integral part of the I/O. Results highlight the observation that system performance is often limited by the device and interconnect parasitics, which have become increasingly more dominant with smaller geometries
Keywords :
CMOS integrated circuits; VLSI; integrated logic circuits; 100 MHz; 150 K gate arrays; 3.3 V; 500 nm; CMOS technology; array efficiency; channelless gate array; core cell; density; device parasitics; high-speed high-integrity clock signals; interconnect parasitics; level-sensitive set-scan registers; performance; place and route software; power distribution system; routability; sea of gates; semicustom VLSI devices; smaller geometries; synchronous data operations; system performance; system speeds; testability; tradeoffs; CMOS technology; Clocks; Computer architecture; Geometry; Power distribution; Software performance; System performance; System testing; Vehicles; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.1016
Filename :
1016
Link To Document :
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