Title :
Optical Diagnostics of Semiconductors
Author :
Fouquet, J.E. ; Merz, J.L.
Keywords :
Optical films; Optical interferometry; Optical refraction; Optical scattering; Optical sensors; Optical variables control; Production; Semiconductor devices; Surface emitting lasers; Vertical cavity surface emitting lasers;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.1995.488394
