Title :
Weakly-Coupled Resonators in Capacitive Readout Circuits
Author :
Hafizi-Moori, Siamak ; Cretu, Edmond
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
Abstract :
Low energy consumption and wide operating temperature range of capacitors made them common in sensor designs, e.g., MEMS accelerometers, and hence increased the popularity of capacitive readout circuits. Their main challenges, in either discrete or integrated implementations, are sensitivity, noise, energy consumption, and parasitic components at the analog front end. Compared to conventional “frequency-shift monitoring” which is one of the most accurate and common methods for capacitance measurements, weakly-coupled resonators (well-known in mechanical systems) can offer up to three orders of magnitude increase in sensitivity. Therefore, this concept has been recently applied to the design of micromechanical sensors, e.g., for sensitive mass sensing. This paper applies, for the first time in the electrical domain, the concept of monitoring the eigenstates variations in weakly-coupled resonators as a generic readout circuit technique for measuring very small capacitance changes. The outstanding sensitivity of this method is verified analytically and demonstrated using both extensive circuit simulations and experimental measurements.
Keywords :
accelerometers; capacitance measurement; micromechanical resonators; microsensors; readout electronics; MEMS accelerometers; analog front end; capacitance measurements; capacitive readout circuits; discrete implementations; eigenstates variations; electrical domain; energy consumption; experimental measurements; extensive circuit simulations; frequency-shift monitoring; generic readout circuit technique; integrated implementations; mass sensing sensitivity; mechanical systems; micromechanical sensors; parasitic components; sensor designs; weakly-coupled resonators; Capacitance; Capacitors; Couplings; Eigenvalues and eigenfunctions; RLC circuits; Resonant frequency; Sensitivity; Capacitive readout; eigenstates; mode localization; resonant circuits; veering;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2014.2365331