• DocumentCode
    777062
  • Title

    Visible emission contours for neon plasmas in silicon microcavity discharge devices: pressure dependence of spatially resolved fluorescence above the anode plane

  • Author

    Ostrom, Nels P. ; Eden, J. Gary

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
  • Volume
    33
  • Issue
    2
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    576
  • Lastpage
    577
  • Abstract
    Images of the Ne plasma plume residing above the microcavity of a Si inverted square pyramid microdischarge device have been obtained with an optical telescope and a charged-coupled device camera. Viewing the discharge along the device surface show the plume to be approximately hemispherical with a bright core having a width (at the surface) of ∼140 μm for pNe=300 torr. The dependence of the plume contour on pressure is in qualitative agreement with recent computational results (Kushner, 2004).
  • Keywords
    discharges (electric); neon; plasma diagnostics; plasma pressure; 300 torr; Ne; Ne plasma plume; Si inverted square pyramid microdischarge device; anode plane; charged-coupled device camera; device surface; neon plasmas; optical telescope; silicon microcavity discharge devices; spatially resolved fluorescence; visible emission contours; Anodes; Fluorescence; Microcavities; Optical devices; Plasma devices; Silicon; Spatial resolution; Stimulated emission; Surface discharges; Telescopes; Fluorescence; microcavity plasma; microdischarge;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2005.845289
  • Filename
    1420584