DocumentCode :
777125
Title :
Near-field probe measurements of microwave scattering from discontinuities in planar surfaces
Author :
Schultz, John W. ; Hopkins, Edward J. ; Kuster, Eric J.
Author_Institution :
Georgia Tech Res. Inst., Atlanta, GA, USA
Volume :
51
Issue :
9
fYear :
2003
fDate :
9/1/2003 12:00:00 AM
Firstpage :
2361
Lastpage :
2368
Abstract :
In microwave scattering, nonradiating fields may contribute to radiating fields by local perturbations such as geometric discontinuities or variations in impedance or electromagnetic properties. Near-field measurements of scattering bodies provide insight into these scattering mechanisms by measuring both radiated and nonradiated fields. In this research, an H-field probe measured scattering from simple discontinuities in planar bodies at frequencies between 2 and 10 GHz. Illumination of the test-body was furnished by a focused lens system with a Gaussian-like tapered beam that locally illuminated inhomogeneities on the body. Measured data and model calculations are presented for scattered H-fields near canonical discontinuities (e.g. gaps and edges in conducting planes). Calculations of the plane wave spectrum of the measured and modeled data were used to distinguish specular reflected components from surface modes. A focused beam was simulated in a finite-difference time-domain (FDTD) model with a weighted sum of plane waves. FDTD results agreed with the measured near-field data.
Keywords :
electric impedance; electromagnetic wave scattering; finite difference time-domain analysis; microwave measurement; FDTD model; Gaussian-like tapered beam; H-field probe; discontinuities; finite-difference time-domain model; focused lens system; impedance; microwave scattering; near-field probe measurements; nonradiating fields; planar surfaces; plane wave spectrum; plane waves; radiating fields; scattering bodies; specular reflected components; weighted sum; Electromagnetic fields; Electromagnetic measurements; Electromagnetic radiation; Electromagnetic scattering; Finite difference methods; Frequency measurement; Microwave measurements; Probes; Surface impedance; Time domain analysis;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2003.816320
Filename :
1229905
Link To Document :
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