• DocumentCode
    777317
  • Title

    Characterization of a self-magnetic-pinched diode

  • Author

    Hinshelwood, David ; Cooperstein, G. ; Mosher, D. ; Ponce, D.M. ; Strasburg, S.D. ; Swanekamp, S.B. ; Stephanakis, S.J. ; Weber, B.V. ; Young, F.C. ; Critchley, A. ; Crotch, I. ; Threadgold, J.

  • Author_Institution
    Plasma Phys. Div., Naval Res. Lab., Washington, DC, USA
  • Volume
    33
  • Issue
    2
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    696
  • Lastpage
    703
  • Abstract
    Self-magnetic-pinched diode behavior at 1.5-2 MV was diagnosed using a variety of electrical, radiation, and optical diagnostics. Results are compared with predictions of the LSP particle-in-cell code, and shown to be in good agreement. A practical diagnostic of electron incidence angles is demonstrated. A quadrature interferometer is shown to be capable of measuring the time-dependent position of the effective electrode-plasma boundaries. Both one-dimensional (1-D) and two-dimensional (2-D) interferometry show the importance of anode plasma expansion in such diodes with high anode-power concentration. Not only does the anode plasma contribute significantly to gap closure, but there is evidence that anode plasma expansion results in a distortion of the effective anode shape, which can significantly affect the diode performance.
  • Keywords
    pinch effect; plasma X-ray sources; plasma diagnostics; plasma diodes; plasma flow; plasma simulation; plasma transport processes; 1.5 to 2 MV; LSP particle-in-cell code; anode plasma expansion; anode-power concentration; electrical diagnostics; electrode-plasma boundaries; electron incidence angles; gap closure; optical diagnostics; quadrature interferometer; radiation diagnostics; self-magnetic-pinched diode; Anodes; Diodes; Electron optics; Optical distortion; Optical interferometry; Plasma diagnostics; Plasma measurements; Position measurement; Shape; Two dimensional displays; Electron beams; particle beams; pinched-beam diodes; pulsed power; radiography;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2005.845305
  • Filename
    1420609