Title :
Design of a 128-mb SOI DRAM using the floating body cell (FBC)
Author :
Ohsawa, Takashi ; Fujita, Katsuyuki ; Hatsuda, Kosuke ; Higashi, Tomoki ; Shino, Tomoaki ; Minami, Yoshihiro ; Nakajima, Hiroomi ; Morikado, Mutsuo ; Inoh, Kazumi ; Hamamoto, Takeshi ; Watanabe, Shigeyoshi ; Fujii, Shuso ; Furuyama, Tohru
Author_Institution :
SoC R&D Center, Toshiba Corp. Semicond. Co., Kanagawa, Japan
Abstract :
A 128-Mb SOI DRAM has been developed featuring the floating body cell (FBC). To keep the cell data state from being degraded by the word-line (WL) disturb due to the charge pumping and to reduce the refresh busy rate, a sense amplifier (S/A) is arranged for every bit-line (BL) and replenishes data "1" cells\´ bodies with holes which are lost by the disturb in every read and write cycle. The power is reduced by operating the S/As asymmetrically between the selected and the unselected thanks to that the number of holes to be replenished in the unselected S/As for charge pumping is two order of magnitude smaller than that required for writing the data "1". The multi-pair averaging of dummy cells generates a very accurate reference current for distinguishing the data "1" and "0" and a Monte Carlo simulation shows that it achieves a sensing scheme robust enough to realize all good parts of the DRAM with a reasonable amount of redundancy. The cell\´s feature of quasi-nondestructive read-out is also advantageous for making an SRAM interface of the DRAM or hiding refresh from uses without sacrificing the access time.
Keywords :
DRAM chips; Monte Carlo methods; circuit stability; integrated circuit design; logic design; redundancy; silicon-on-insulator; 128 Mbit; DRAM robustness; Monte Carlo simulation; SOI DRAM; charge pumping; dummy cells; floating body cell; multi-pair averaging; quasi-nondestructive read-out; redundancy; sense amplifier; silicon-on-insulator technology; word-line disturb; Capacitance; Capacitors; Charge pumps; Contacts; Degradation; Immune system; Material storage; Random access memory; Research and development; System-on-a-chip; 1T-DRAM; capacitorless DRAM; embedded memory; floating body cell; silicon-on-insulator technology; system-on-a-chip;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.0051.859018